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increase the timeouts to 10mins for nfc target-side tests

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Test: local direct binary runs (1.5mins on average)
Change-Id: Id85633a6a4a55a9d6876142447521146cd6e57f3
(cherry picked from commit c029996117)
This commit is contained in:
Keun Soo Yim 2016-11-30 13:46:00 -08:00 committed by Ruchi Kandoi
parent 12b532c8f3
commit 4fbf78481e
2 changed files with 2 additions and 2 deletions
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2
nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml
View file

@ -26,6 +26,6 @@
"/>
<option name="test-config-path" value="vts/testcases/hal/nfc/hidl/target/HalNfcHidlTargetBasicTest.config" />
<option name="binary-test-type" value="gtest" />
<option name="test-timeout" value="1m" />
<option name="test-timeout" value="10m" />
</test>
</configuration>

2
nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml
View file

@ -25,7 +25,7 @@
_64bit::DATA/nativetest64/nfc_hidl_hal_test/nfc_hidl_hal_test,
"/>
<option name="binary-test-type" value="gtest" />
<option name="test-timeout" value="1m" />
<option name="test-timeout" value="10m" />
<option name="enable-profiling" value="true" />
</test>
</configuration>