Merge "Convert VtsHalNfcV1_*TargetTest to be parameterized test"

nfc/1.0/vts/functional/Android.bp

@@ -21,5 +21,5 @@ cc_test {
     static_libs: [
         "android.hardware.nfc@1.0",
     ],
-    test_suites: ["general-tests"],
+    test_suites: ["general-tests", "vts-core"],
 }

nfc/1.0/vts/functional/AndroidTest.xml

@@ -0,0 +1,33 @@
+<?xml version="1.0" encoding="utf-8"?>
+<!-- Copyright (C) 2019 The Android Open Source Project
+
+     Licensed under the Apache License, Version 2.0 (the "License");
+     you may not use this file except in compliance with the License.
+     You may obtain a copy of the License at
+
+          http://www.apache.org/licenses/LICENSE-2.0
+
+     Unless required by applicable law or agreed to in writing, software
+     distributed under the License is distributed on an "AS IS" BASIS,
+     WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+     See the License for the specific language governing permissions and
+     limitations under the License.
+-->
+<configuration description="Runs VtsHalNfcV1_0TargetTest.">
+    <option name="test-suite-tag" value="apct" />
+    <option name="test-suite-tag" value="apct-native" />
+
+    <target_preparer class="com.android.tradefed.targetprep.RootTargetPreparer">
+    </target_preparer>
+
+    <target_preparer class="com.android.tradefed.targetprep.PushFilePreparer">
+        <option name="cleanup" value="true" />
+        <option name="push" value="VtsHalNfcV1_0TargetTest->/data/local/tmp/VtsHalNfcV1_0TargetTest" />
+    </target_preparer>
+
+    <test class="com.android.tradefed.testtype.GTest" >
+        <option name="native-test-device-path" value="/data/local/tmp" />
+        <option name="module-name" value="VtsHalNfcV1_0TargetTest" />
+        <option name="native-test-timeout" value="180000"/>
+    </test>
+</configuration>

nfc/1.0/vts/functional/VtsHalNfcV1_0TargetTest.cpp

@@ -20,11 +20,12 @@
 #include <android/hardware/nfc/1.0/INfc.h>
 #include <android/hardware/nfc/1.0/INfcClientCallback.h>
 #include <android/hardware/nfc/1.0/types.h>
+#include <gtest/gtest.h>
 #include <hardware/nfc.h>
+#include <hidl/GtestPrinter.h>
+#include <hidl/ServiceManagement.h>
 
 #include <VtsHalHidlTargetCallbackBase.h>
-#include <VtsHalHidlTargetTestBase.h>
-#include <VtsHalHidlTargetTestEnvBase.h>
 
 using ::android::hardware::nfc::V1_0::INfc;
 using ::android::hardware::nfc::V1_0::INfcClientCallback;
@@ -94,26 +95,11 @@ class NfcClientCallback
     };
 };
 
-// Test environment for Nfc HIDL HAL.
-class NfcHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase {
- public:
-  // get the test environment singleton
-  static NfcHidlEnvironment* Instance() {
-    static NfcHidlEnvironment* instance = new NfcHidlEnvironment;
-    return instance;
-  }
-
-  virtual void registerTestServices() override { registerTestService<INfc>(); }
- private:
-  NfcHidlEnvironment() {}
-};
-
 // The main test class for NFC HIDL HAL.
-class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {
+class NfcHidlTest : public ::testing::TestWithParam<std::string> {
  public:
   virtual void SetUp() override {
-    nfc_ = ::testing::VtsHalHidlTargetTestBase::getService<INfc>(
-        NfcHidlEnvironment::Instance()->getServiceName<INfc>());
+    nfc_ = INfc::getService(GetParam());
     ASSERT_NE(nfc_, nullptr);
 
     nfc_cb_ = new NfcClientCallback();
@@ -186,7 +172,7 @@ class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {
  * Since open and close calls are a part of SetUp() and TearDown(),
  * the function definition is intentionally kept empty
  */
-TEST_F(NfcHidlTest, OpenAndClose) {}
+TEST_P(NfcHidlTest, OpenAndClose) {}
 
 /*
  * WriteCoreReset:
@@ -194,7 +180,7 @@ TEST_F(NfcHidlTest, OpenAndClose) {}
  * Waits for CORE_RESET_RSP
  * Checks the status, version number and configuration status
  */
-TEST_F(NfcHidlTest, WriteCoreReset) {
+TEST_P(NfcHidlTest, WriteCoreReset) {
   std::vector<uint8_t> cmd = CORE_RESET_CMD;
   NfcData data = cmd;
   EXPECT_EQ(data.size(), nfc_->write(data));
@@ -229,7 +215,7 @@ TEST_F(NfcHidlTest, WriteCoreReset) {
  * Waits for CORE_RESET_RSP
  * Checks the status, version number and configuration status
  */
-TEST_F(NfcHidlTest, WriteCoreResetConfigReset) {
+TEST_P(NfcHidlTest, WriteCoreResetConfigReset) {
   std::vector<uint8_t> cmd = CORE_RESET_CMD_CONFIG_RESET;
   NfcData data = cmd;
   EXPECT_EQ(data.size(), nfc_->write(data));
@@ -264,7 +250,7 @@ TEST_F(NfcHidlTest, WriteCoreResetConfigReset) {
  * Waits for response
  * Checks SYNTAX_ERROR status
  */
-TEST_F(NfcHidlTest, WriteInvalidCommand) {
+TEST_P(NfcHidlTest, WriteInvalidCommand) {
   // Send an Error Command
   std::vector<uint8_t> cmd = INVALID_COMMAND;
   NfcData data = cmd;
@@ -285,7 +271,7 @@ TEST_F(NfcHidlTest, WriteInvalidCommand) {
  * Send CORE_CONN_CREATE_CMD for loop-back mode
  * Check the response
  */
-TEST_F(NfcHidlTest, WriteInvalidAndThenValidCommand) {
+TEST_P(NfcHidlTest, WriteInvalidAndThenValidCommand) {
     std::vector<uint8_t> cmd = CORE_RESET_CMD;
     NfcData data = cmd;
     EXPECT_EQ(data.size(), nfc_->write(data));
@@ -349,7 +335,7 @@ TEST_F(NfcHidlTest, WriteInvalidAndThenValidCommand) {
  * Checks the data received
  * Repeat to send total of 1Mb data
  */
-TEST_F(NfcHidlTest, Bandwidth) {
+TEST_P(NfcHidlTest, Bandwidth) {
     std::vector<uint8_t> cmd = CORE_RESET_CMD;
     NfcData data = cmd;
     EXPECT_EQ(data.size(), nfc_->write(data));
@@ -437,7 +423,7 @@ TEST_F(NfcHidlTest, Bandwidth) {
  * Waits for NfcEvent.OPEN_CPLT
  * Checks status
  */
-TEST_F(NfcHidlTest, PowerCycle) {
+TEST_P(NfcHidlTest, PowerCycle) {
   EXPECT_EQ(NfcStatus::OK, nfc_->powerCycle());
   // Wait for NfcEvent.OPEN_CPLT
   auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -451,7 +437,7 @@ TEST_F(NfcHidlTest, PowerCycle) {
  * Calls powerCycle() after close()
  * Checks status
  */
-TEST_F(NfcHidlTest, PowerCycleAfterClose) {
+TEST_P(NfcHidlTest, PowerCycleAfterClose) {
   EXPECT_EQ(NfcStatus::OK, nfc_->close());
   // Wait for CLOSE_CPLT event
   auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -474,7 +460,7 @@ TEST_F(NfcHidlTest, PowerCycleAfterClose) {
  * Calls coreInitialized() with different data
  * Waits for NfcEvent.POST_INIT_CPLT
  */
-TEST_F(NfcHidlTest, CoreInitialized) {
+TEST_P(NfcHidlTest, CoreInitialized) {
   NfcData data;
   data.resize(1);
   // These parameters might lead to device specific proprietary behavior
@@ -501,7 +487,7 @@ TEST_F(NfcHidlTest, CoreInitialized) {
  * Calls controlGranted()
  * Checks the return value
  */
-TEST_F(NfcHidlTest, ControlGranted) {
+TEST_P(NfcHidlTest, ControlGranted) {
   EXPECT_EQ(NfcStatus::OK, nfc_->controlGranted());
 }
 
@@ -510,7 +496,7 @@ TEST_F(NfcHidlTest, ControlGranted) {
  * Call controlGranted() after close
  * Checks the return value
  */
-TEST_F(NfcHidlTest, ControlGrantedAfterClose) {
+TEST_P(NfcHidlTest, ControlGrantedAfterClose) {
   EXPECT_EQ(NfcStatus::OK, nfc_->close());
   // Wait for CLOSE_CPLT event
   auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -532,7 +518,7 @@ TEST_F(NfcHidlTest, ControlGrantedAfterClose) {
  * Calls prediscover()
  * Checks the return value
  */
-TEST_F(NfcHidlTest, PreDiscover) {
+TEST_P(NfcHidlTest, PreDiscover) {
   EXPECT_EQ(NfcStatus::OK, nfc_->prediscover());
 }
 
@@ -541,7 +527,7 @@ TEST_F(NfcHidlTest, PreDiscover) {
  * Call prediscover() after close
  * Checks the return value
  */
-TEST_F(NfcHidlTest, PreDiscoverAfterClose) {
+TEST_P(NfcHidlTest, PreDiscoverAfterClose) {
   EXPECT_EQ(NfcStatus::OK, nfc_->close());
   // Wait for CLOSE_CPLT event
   auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -564,7 +550,7 @@ TEST_F(NfcHidlTest, PreDiscoverAfterClose) {
  * Calls close() multiple times
  * Checks status
  */
-TEST_F(NfcHidlTest, CloseAfterClose) {
+TEST_P(NfcHidlTest, CloseAfterClose) {
   EXPECT_EQ(NfcStatus::OK, nfc_->close());
   // Wait for CLOSE_CPLT event
   auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -587,15 +573,18 @@ TEST_F(NfcHidlTest, CloseAfterClose) {
  * Calls open() multiple times
  * Checks status
  */
-TEST_F(NfcHidlTest, OpenAfterOpen) {
+TEST_P(NfcHidlTest, OpenAfterOpen) {
   EXPECT_EQ(NfcStatus::OK, nfc_->open(nfc_cb_));
   EXPECT_EQ(NfcStatus::OK, nfc_->open(nfc_cb_));
 }
 
+INSTANTIATE_TEST_SUITE_P(
+        PerInstance, NfcHidlTest,
+        testing::ValuesIn(android::hardware::getAllHalInstanceNames(INfc::descriptor)),
+        android::hardware::PrintInstanceNameToString);
+
 int main(int argc, char** argv) {
-  ::testing::AddGlobalTestEnvironment(NfcHidlEnvironment::Instance());
   ::testing::InitGoogleTest(&argc, argv);
-  NfcHidlEnvironment::Instance()->init(&argc, argv);
 
   std::system("svc nfc disable"); /* Turn off NFC */
   sleep(5);

nfc/1.1/vts/functional/Android.bp

@@ -22,5 +22,5 @@ cc_test {
         "android.hardware.nfc@1.0",
         "android.hardware.nfc@1.1",
     ],
-    test_suites: ["general-tests"],
+    test_suites: ["general-tests", "vts-core"],
 }

nfc/1.1/vts/functional/VtsHalNfcV1_1TargetTest.cpp

@@ -21,11 +21,12 @@
 #include <android/hardware/nfc/1.1/INfc.h>
 #include <android/hardware/nfc/1.1/INfcClientCallback.h>
 #include <android/hardware/nfc/1.1/types.h>
+#include <gtest/gtest.h>
 #include <hardware/nfc.h>
+#include <hidl/GtestPrinter.h>
+#include <hidl/ServiceManagement.h>
 
 #include <VtsHalHidlTargetCallbackBase.h>
-#include <VtsHalHidlTargetTestBase.h>
-#include <VtsHalHidlTargetTestEnvBase.h>
 
 using ::android::hardware::nfc::V1_1::INfc;
 using ::android::hardware::nfc::V1_1::INfcClientCallback;
@@ -83,25 +84,11 @@ class NfcClientCallback : public ::testing::VtsHalHidlTargetCallbackBase<NfcClie
     };
 };
 
-// Test environment for Nfc HIDL HAL.
-class NfcHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase {
-   public:
-    // get the test environment singleton
-    static NfcHidlEnvironment* Instance() {
-        static NfcHidlEnvironment* instance = new NfcHidlEnvironment;
-        return instance;
-    }
-
-    virtual void registerTestServices() override { registerTestService<INfc>(); }
-   private:
-    NfcHidlEnvironment() {}
-};
-
 // The main test class for NFC HIDL HAL.
-class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {
+class NfcHidlTest : public ::testing::TestWithParam<std::string> {
    public:
     virtual void SetUp() override {
-        nfc_ = ::testing::VtsHalHidlTargetTestBase::getService<INfc>();
+        nfc_ = INfc::getService(GetParam());
         ASSERT_NE(nfc_, nullptr);
 
         nfc_cb_ = new NfcClientCallback();
@@ -151,7 +138,7 @@ class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {
  * calls factoryReset()
  * checks status
  */
-TEST_F(NfcHidlTest, FactoryReset) {
+TEST_P(NfcHidlTest, FactoryReset) {
     nfc_->factoryReset();
 
     EXPECT_EQ(NfcStatus::OK, nfc_->close());
@@ -174,7 +161,7 @@ TEST_F(NfcHidlTest, FactoryReset) {
  * Makes an open call, waits for NfcEvent.OPEN_CPLT
  * Immediately calls closeforPowerOffCase() and waits for NfcEvent.CLOSE_CPLT
  */
-TEST_F(NfcHidlTest, OpenAndCloseForPowerOff) {
+TEST_P(NfcHidlTest, OpenAndCloseForPowerOff) {
     EXPECT_EQ(NfcStatus::OK, nfc_->closeForPowerOffCase());
     // Wait for CLOSE_CPLT event
     auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -195,7 +182,7 @@ TEST_F(NfcHidlTest, OpenAndCloseForPowerOff) {
  * Calls closeForPowerOffCase()
  * Calls close() - checks failed status
  */
-TEST_F(NfcHidlTest, CloseForPowerCaseOffAfterClose) {
+TEST_P(NfcHidlTest, CloseForPowerCaseOffAfterClose) {
     EXPECT_EQ(NfcStatus::OK, nfc_->closeForPowerOffCase());
     // Wait for CLOSE_CPLT event
     auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -218,16 +205,19 @@ TEST_F(NfcHidlTest, CloseForPowerCaseOffAfterClose) {
  * Calls getConfig()
  * checks if fields in NfcConfig are populated correctly
  */
-TEST_F(NfcHidlTest, GetConfig) {
+TEST_P(NfcHidlTest, GetConfig) {
     nfc_->getConfig([](NfcConfig config) {
         EXPECT_GE(config.maxIsoDepTransceiveLength, MIN_ISO_DEP_TRANSCEIVE_LENGTH);
     });
 }
 
+INSTANTIATE_TEST_SUITE_P(
+        PerInstance, NfcHidlTest,
+        testing::ValuesIn(android::hardware::getAllHalInstanceNames(INfc::descriptor)),
+        android::hardware::PrintInstanceNameToString);
+
 int main(int argc, char** argv) {
-    ::testing::AddGlobalTestEnvironment(NfcHidlEnvironment::Instance());
     ::testing::InitGoogleTest(&argc, argv);
-    NfcHidlEnvironment::Instance()->init(&argc, argv);
 
     std::system("svc nfc disable"); /* Turn off NFC */
     sleep(5);

nfc/1.2/vts/functional/Android.bp

@@ -23,4 +23,5 @@ cc_test {
         "android.hardware.nfc@1.1",
         "android.hardware.nfc@1.2",
     ],
+    test_suites: ["general-tests", "vts-core"],
 }

nfc/1.2/vts/functional/VtsHalNfcV1_2TargetTest.cpp

@@ -20,11 +20,12 @@
 #include <android/hardware/nfc/1.1/INfcClientCallback.h>
 #include <android/hardware/nfc/1.2/INfc.h>
 #include <android/hardware/nfc/1.2/types.h>
+#include <gtest/gtest.h>
 #include <hardware/nfc.h>
+#include <hidl/GtestPrinter.h>
+#include <hidl/ServiceManagement.h>
 
 #include <VtsHalHidlTargetCallbackBase.h>
-#include <VtsHalHidlTargetTestBase.h>
-#include <VtsHalHidlTargetTestEnvBase.h>
 
 using ::android::sp;
 using ::android::hardware::hidl_vec;
@@ -83,26 +84,11 @@ class NfcClientCallback : public ::testing::VtsHalHidlTargetCallbackBase<NfcClie
     };
 };
 
-// Test environment for Nfc HIDL HAL.
-class NfcHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase {
-   public:
-    // get the test environment singleton
-    static NfcHidlEnvironment* Instance() {
-        static NfcHidlEnvironment* instance = new NfcHidlEnvironment;
-        return instance;
-    }
-
-    virtual void registerTestServices() override { registerTestService<INfc>(); }
-
-   private:
-    NfcHidlEnvironment() {}
-};
-
 // The main test class for NFC HIDL HAL.
-class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {
+class NfcHidlTest : public ::testing::TestWithParam<std::string> {
    public:
     virtual void SetUp() override {
-        nfc_ = ::testing::VtsHalHidlTargetTestBase::getService<INfc>();
+        nfc_ = INfc::getService(GetParam());
         ASSERT_NE(nfc_, nullptr);
 
         nfc_cb_ = new NfcClientCallback();
@@ -152,7 +138,7 @@ class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {
  * Calls getConfig()
  * checks if fields in NfcConfig are populated correctly
  */
-TEST_F(NfcHidlTest, GetExtendedConfig) {
+TEST_P(NfcHidlTest, GetExtendedConfig) {
     nfc_->getConfig_1_2([](NfcConfig config) {
         for (uint8_t uicc : config.offHostRouteUicc) {
             EXPECT_GE(uicc, MIN_OFFHOST_ROUTE_ID);
@@ -169,10 +155,13 @@ TEST_F(NfcHidlTest, GetExtendedConfig) {
     });
 }
 
+INSTANTIATE_TEST_SUITE_P(
+        PerInstance, NfcHidlTest,
+        testing::ValuesIn(android::hardware::getAllHalInstanceNames(INfc::descriptor)),
+        android::hardware::PrintInstanceNameToString);
+
 int main(int argc, char** argv) {
-    ::testing::AddGlobalTestEnvironment(NfcHidlEnvironment::Instance());
     ::testing::InitGoogleTest(&argc, argv);
-    NfcHidlEnvironment::Instance()->init(&argc, argv);
 
     std::system("svc nfc disable"); /* Turn off NFC */
     sleep(5);