Change port modes randomly before the start of test and see if it
effects the end behavior
Test: make vts -j99 BUILD_GOOGLE_VTS=true TARGET_PRODUCT=aosp_arm64 \
&& vts-tradefed run commandAndExit vts \
--skip-all-system-status-check --primary-abi-only \
--skip-preconditions --module VtsHalMediaOmxV1_0Host \
-l INFO
Bug: 63796949
Change-Id: I28c923b8e6cdc0f7bf6dd394ef6d088ff489e2e0
NDK libc++ does not yet support full C++14. This CL replaced use of
std::get with type as well as auto lambda arguments with equivalent
C++11 constructs in the VTS test harness for NNAPI.
Test: VtsHalNeuralnetworksV1_0TargetTest
Bug: 63905942
Change-Id: If75e7c088e9221a70bcc47bc647e0dd7b045bfa1
This CL adds negative tests to:
* IDevice::getSupportedOperations
* IDevice::prepareModel
* IPreparedModel::execute
It does not make sense to have negative tests for the remaining HAL
entries:
* IDevice::getStatus (all returned values are valid)
* IDevice::getCapabilities (no input or state)
* IEvent::notify (synchronization callback primitive)
Bug: 63905942
Test: mm, running on sample driver has expected output
Change-Id: Ia3cf5ce05dd07ff3f688395b8d0e581851909028
This makes the mock driver (when loaded and running) serve as THE evs
driver for the system. Facilitates VTS tests running, etc.
This driver should not run on a production system as it should have a
"real" driver registered instead.
Change-Id: I716f8f8226e7152521375b94013828a3aa2bb9f0
BUg: 65376941
Test: boot mojave, then 'ps -lef | grep evs'
Skip SensorsHidlTest.*AshmemDirectReportOperation* tests if sensor
is not available on device.
Bug: 64230704
Test: compiles and test pass for a pixel device with mag sensor
masked in hal.
Change-Id: I9bfbea6301891eaa2b272bd3d15b0e237799b5d6
Merged-In: I9bfbea6301891eaa2b272bd3d15b0e237799b5d6
Current accelerometer norm check threshold is tight and cause
unnecessary test flakiness in test environment with small
inevitable vibration (e.g. from people walking by testing
lab).
This CL relax the threshold from 0.5m/s^2 to 1m/s^2.
Test: vts pass
Bug: 62811045
Change-Id: I5d7e736623c892b6e6c9b8ddc5d0f53fa8aaba77
Merged-In: I5d7e736623c892b6e6c9b8ddc5d0f53fa8aaba77
This CL avoids passing nullptr to underlying HAL and cause
SEGFAULT.
Bug: 37589989
Test: compiles and VTS passing
Change-Id: Ic44409e64466e54a3a3027721897c0755ba34fc7
Merged-In: Ic44409e64466e54a3a3027721897c0755ba34fc7
Originally, SamplingRateHotSwitchOperation only tests the case
in which requested sensor sampling rate goes from fast to slow.
Recent regression demonstrates that it is also worthwhile to test
transition in the other direction, i.e. from slow to fast. This
CL add the slow to fast transition test.
Bug: 65138983
Test: sailfish failed the test before being patched.
Test: sailfish passed after being patched (ag/2824590)
Change-Id: If02509c75f74145544f0a2ce5d2aaec24e7326b8
Merged-In: If02509c75f74145544f0a2ce5d2aaec24e7326b8
