Motivation:
1) Support running the test against each hal service instance for the
registered hal.
2) Support testability checker to determine whether we should run the
test on the taget device.
3) Help to determine the process we want to profile for coverage data
if running on coverage build.
Bug: 64203181
Test: make vts
vts-tradefed run vts -m VtsHalBootV1_0Target
vts-tradefed run vts -m VtsHalMemtrackV1_0Target
vts-tradefed run vts -m VtsHalPowerV1_0Target
vts-tradefed run vts -m VtsHalPowerV1_1Target
Change-Id: Ie0bbd9ef9d9fbe11de5aee70fad9028fa0ae897c
Removing whenever I see these in code reviews.
Test: none
Merged-In: I4322f533a837d55618ec2ed2125e8966ace9d61d
Change-Id: I4322f533a837d55618ec2ed2125e8966ace9d61d
Removing whenever I see these in code reviews.
Test: none
Merged-In: I4322f533a837d55618ec2ed2125e8966ace9d61d
Change-Id: I4322f533a837d55618ec2ed2125e8966ace9d61d
Default implementation in powerHAL 1.1 is not used by any device
Devices using powerHal 1.1 have their own implementation in their
device/<vendor>/<devicename> while older devices don't use 1.1 at all.
This CL removes the default implementation for the PowerHAL 1.1
Bug: 65453628
Test: Build successfully (code not used anyway)
Merged-In: I695348683c6e2e504a523897082543274dc239aa
Change-Id: I695348683c6e2e504a523897082543274dc239aa
Signed-off-by: Ahmed ElArabawy <arabawy@google.com>
And use VtsHalTargetTestDefaults.
This is a partial cherry-pick of ag/2657080.
Bug: 64040096
Test: compiles, works fine in internal master
Merged-In: I8f6995e9536a9aefe283ee3effec9f5a7f03b620
Change-Id: I76d47d8546416b57055841851a9d343026cd3210
This reverts commit 8ac1971678.
Reason for revert: Didn't remove automotive changes from this CL.
Merged-In: I8608c8f636c35f21e4246a805a9eff6d14124e0a
Change-Id: I1c660cffc8817ad0b33da9f6eceb3d88e7c48416
And use VtsHalTargetTestDefaults.
Bug: 64040096
Test: crop out all non-affected tests from vts-hal-hidl.xml and run
vts-tradefed run commandAndExit vts-hal-hidl --skip-all-system-status-check
--skip-preconditions
2 failures, same as without this change:
GatekeeperHidlTest.DeleteAllUsersTest
GatekeeperHidlTest.DeleteUserTest
Change-Id: I8f6995e9536a9aefe283ee3effec9f5a7f03b620
Update the Android.bp generated with hidl-gen.
Test: build with and without BOARD_VNDK_VERSION=current
Bug: 63866913
Change-Id: I1a9db1df49e0f13c5790da2b118ae9ec63ba34a7
Allow HAL definition libs to be static.
Bug: 32920003
Bug: 64040096
Test: update-all-google-makefiles.sh
Change-Id: I1483d572bea6799717d1614fb7d52fe225e31104
Add an async version of powerHint called powerHintAsync.
Bug: 62377008
Test: Take systrace, confirm powerHint is now an async HIDL transaction
Change-Id: I7c4d850ef17c909977675771d6c2b8a3fa1609d2
The test should return when it cannot open cpu governor files
BUG: 62138092
Test: build sdk_gphone_x86-userdebug, launch emulator,
run test: run vts -m VtsHalPowerV1_0Target
The test should all pass.
Change-Id: I3b47261e9525b6a04e995dac1ad63d9cc088b004
These makefiles are not in dev topic branches
or AOSP currently so they were not updated. This
update adds hidl-generated-module defaults.
Test: pass
Change-Id: Ie52c54877d795bf5358aa600e6d1a13a4f166d25
Note cleanspec required because of b/38205169 (genrule
doesn't delete output files before building, so when
removing some, they get stale).
Test: power vts test compiles
Change-Id: Ie7ef0fc3d943a75fe898238cf861fb7f99f4146b
Fixes: 35813011
Some branch is complaining:
error: undefined reference to 'android::hardware::power::V1_0::IPower::unlinkToDeath(android::sp<android::hardware::hidl_death_recipient> const&)'
Test: N/A
Test: works on master branch
Change-Id: Ifbd47fd47312e02e25eb326f374c71c7dceb2944
Extend APIs to collect subsystem low power statistics.
Many subsystems (e.g.wifi) could be living on an
independent power island (sourced from VBatt directly)
and might even have their own dedicated XTAL to source
their clocks. Since these SOCs are capable of
autonomously operating (while the platform is in one
of the sleep states), they are still drawing power
from the VBatt. Hence it is critical to understand
the (SOC) level low power statistics as well when
the battery level changes and be able to find any
correlation in event of unexpected battery drain.
Bug: 29339696
Test: VTS
Change-Id: I1b6ea557dbdf1aa06e9560635fcba8d54afabda7
Signed-off-by: Ahmed ElArabawy <arabawy@google.com>
