platform_hardware_interfaces/nfc/1.2/vts/functional/VtsHalNfcV1_2TargetTest.cpp
Dan Shi ba4d532fee Suppress gtest error for tests without any instance
Bug: 162052785
Test: m -j vts
Change-Id: I8c1a48e6fbd7c8161137902b5332911fa0d7b8b3
2020-07-28 15:12:32 -07:00

177 lines
6 KiB
C++

/*
* Copyright (C) 2018 The Android Open Source Project
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
#define LOG_TAG "nfc_hidl_hal_test"
#include <android-base/logging.h>
#include <android/hardware/nfc/1.1/INfcClientCallback.h>
#include <android/hardware/nfc/1.2/INfc.h>
#include <android/hardware/nfc/1.2/types.h>
#include <gtest/gtest.h>
#include <hardware/nfc.h>
#include <hidl/GtestPrinter.h>
#include <hidl/ServiceManagement.h>
#include <VtsHalHidlTargetCallbackBase.h>
using ::android::sp;
using ::android::hardware::hidl_vec;
using ::android::hardware::Return;
using ::android::hardware::Void;
using ::android::hardware::nfc::V1_0::NfcData;
using ::android::hardware::nfc::V1_0::NfcStatus;
using ::android::hardware::nfc::V1_1::INfcClientCallback;
using ::android::hardware::nfc::V1_1::NfcEvent;
using ::android::hardware::nfc::V1_2::INfc;
using ::android::hardware::nfc::V1_2::NfcConfig;
// Range of valid off host route ids
constexpr unsigned int MIN_OFFHOST_ROUTE_ID = 0x01;
constexpr unsigned int MAX_OFFHOST_ROUTE_ID = 0xFE;
constexpr char kCallbackNameSendEvent[] = "sendEvent";
constexpr char kCallbackNameSendData[] = "sendData";
class NfcClientCallbackArgs {
public:
NfcEvent last_event_;
NfcStatus last_status_;
NfcData last_data_;
};
/* Callback class for data & Event. */
class NfcClientCallback : public ::testing::VtsHalHidlTargetCallbackBase<NfcClientCallbackArgs>,
public INfcClientCallback {
public:
virtual ~NfcClientCallback() = default;
/* sendEvent callback function - Records the Event & Status
* and notifies the TEST
**/
Return<void> sendEvent_1_1(NfcEvent event, NfcStatus event_status) override {
NfcClientCallbackArgs args;
args.last_event_ = event;
args.last_status_ = event_status;
NotifyFromCallback(kCallbackNameSendEvent, args);
return Void();
};
/** NFC 1.1 HAL shouldn't send 1.0 callbacks */
Return<void> sendEvent(__attribute__((unused))::android::hardware::nfc::V1_0::NfcEvent event,
__attribute__((unused)) NfcStatus event_status) override {
return Void();
}
/* sendData callback function. Records the data and notifies the TEST*/
Return<void> sendData(const NfcData& data) override {
NfcClientCallbackArgs args;
args.last_data_ = data;
NotifyFromCallback(kCallbackNameSendData, args);
return Void();
};
};
// The main test class for NFC HIDL HAL.
class NfcHidlTest : public ::testing::TestWithParam<std::string> {
public:
virtual void SetUp() override {
nfc_ = INfc::getService(GetParam());
ASSERT_NE(nfc_, nullptr);
nfc_cb_ = new NfcClientCallback();
ASSERT_NE(nfc_cb_, nullptr);
EXPECT_EQ(NfcStatus::OK, nfc_->open_1_1(nfc_cb_));
// Wait for OPEN_CPLT event
auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
EXPECT_TRUE(res.no_timeout);
EXPECT_EQ(NfcEvent::OPEN_CPLT, res.args->last_event_);
EXPECT_EQ(NfcStatus::OK, res.args->last_status_);
/*
* Close the hal and then re-open to make sure we are in a predictable
* state for all the tests.
*/
EXPECT_EQ(NfcStatus::OK, nfc_->close());
// Wait for CLOSE_CPLT event
res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
EXPECT_TRUE(res.no_timeout);
EXPECT_EQ(NfcEvent::CLOSE_CPLT, res.args->last_event_);
EXPECT_EQ(NfcStatus::OK, res.args->last_status_);
EXPECT_EQ(NfcStatus::OK, nfc_->open_1_1(nfc_cb_));
// Wait for OPEN_CPLT event
res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
EXPECT_TRUE(res.no_timeout);
EXPECT_EQ(NfcEvent::OPEN_CPLT, res.args->last_event_);
EXPECT_EQ(NfcStatus::OK, res.args->last_status_);
}
virtual void TearDown() override {
EXPECT_EQ(NfcStatus::OK, nfc_->close());
// Wait for CLOSE_CPLT event
auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
EXPECT_TRUE(res.no_timeout);
EXPECT_EQ(NfcEvent::CLOSE_CPLT, res.args->last_event_);
EXPECT_EQ(NfcStatus::OK, res.args->last_status_);
}
sp<INfc> nfc_;
sp<NfcClientCallback> nfc_cb_;
};
/*
* getConfig:
* Calls getConfig()
* checks if fields in NfcConfig are populated correctly
*/
TEST_P(NfcHidlTest, GetExtendedConfig) {
nfc_->getConfig_1_2([](NfcConfig config) {
for (uint8_t uicc : config.offHostRouteUicc) {
EXPECT_GE(uicc, MIN_OFFHOST_ROUTE_ID);
EXPECT_LE(uicc, MAX_OFFHOST_ROUTE_ID);
}
for (uint8_t ese : config.offHostRouteEse) {
EXPECT_GE(ese, MIN_OFFHOST_ROUTE_ID);
EXPECT_LE(ese, MAX_OFFHOST_ROUTE_ID);
}
if (config.defaultIsoDepRoute != 0) {
EXPECT_GE(config.defaultIsoDepRoute, MIN_OFFHOST_ROUTE_ID);
EXPECT_LE(config.defaultIsoDepRoute, MAX_OFFHOST_ROUTE_ID);
}
});
}
GTEST_ALLOW_UNINSTANTIATED_PARAMETERIZED_TEST(NfcHidlTest);
INSTANTIATE_TEST_SUITE_P(
PerInstance, NfcHidlTest,
testing::ValuesIn(android::hardware::getAllHalInstanceNames(INfc::descriptor)),
android::hardware::PrintInstanceNameToString);
int main(int argc, char** argv) {
::testing::InitGoogleTest(&argc, argv);
std::system("svc nfc disable"); /* Turn off NFC */
sleep(5);
int status = RUN_ALL_TESTS();
LOG(INFO) << "Test result = " << status;
std::system("svc nfc enable"); /* Turn on NFC */
sleep(5);
return status;
}