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platform_hardware_interfaces/security/dice/aidl
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Janis Danisevskis 21244fc192 Dice HAL: Add VTS Test. 
This CL adds a VTS test for the DICE HAL, and a test specific for
demotion testing. Demotion testing leaves the device in a permanently
modified state untill the next reboot, which is why it needs a special
test config. The current test config restarts the device before testing,
in a followup the device also has to reboot after the test.

Bug: 198197213
Test: atest VtsAidlDiceTargetTest
      atest VtsAidlDiceDemoteTargetTest
Change-Id: I4278a1352df749da50dc8e5d118fc37336026061
2022-03-15 12:39:22 -07:00
..
aidl_api/android.hardware.security.dice/current/android/hardware/security/dice DICE: Use fixed sized arrays for fixed sized fields. 2022-01-11 11:06:35 -08:00
android/hardware/security/dice DICE: Use fixed sized arrays for fixed sized fields. 2022-01-11 11:06:35 -08:00
default Dice HAL: Added default implementation. 2022-03-10 12:23:59 -08:00
vts/functional Dice HAL: Add VTS Test. 2022-03-15 12:39:22 -07:00
Android.bp Allow CompOS to use DICE from C++ 2022-02-10 15:05:48 +00:00