Keun Soo Yim 4fbf78481e increase the timeouts to 10mins for nfc target-side tests ... Test: local direct binary runs (1.5mins on average) Change-Id: Id85633a6a4a55a9d6876142447521146cd6e57f3 (cherry picked from commit c029996117)		2017-01-12 11:02:22 -08:00
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1.0	increase the timeouts to 10mins for nfc target-side tests	2017-01-12 11:02:22 -08:00
Android.bp	Stop all these merge conflicts.	2016-10-26 12:05:29 +02:00
Android.mk	move VTS HIDL HAL tests to the corresponding interface directories	2017-01-12 11:02:22 -08:00