platform_hardware_interfaces/nfc/1.0/vts/functional/AndroidTest.xml
Jack Yu f916560188 Extend test timeout value from 180s to 600s
There are several test cases that may take longer duration to complete.
Extend the timeout value to ensure there is sufficient running duration.

Bug: 174717076
Test: atest VtsHalNfcV1_0TargetTest
Change-Id: I4fc15184f0715131c45247820e1edbaae511b8a3
2020-12-11 16:01:45 +08:00

33 lines
1.5 KiB
XML

<?xml version="1.0" encoding="utf-8"?>
<!-- Copyright (C) 2019 The Android Open Source Project
Licensed under the Apache License, Version 2.0 (the "License");
you may not use this file except in compliance with the License.
You may obtain a copy of the License at
http://www.apache.org/licenses/LICENSE-2.0
Unless required by applicable law or agreed to in writing, software
distributed under the License is distributed on an "AS IS" BASIS,
WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
See the License for the specific language governing permissions and
limitations under the License.
-->
<configuration description="Runs VtsHalNfcV1_0TargetTest.">
<option name="test-suite-tag" value="apct" />
<option name="test-suite-tag" value="apct-native" />
<target_preparer class="com.android.tradefed.targetprep.RootTargetPreparer">
</target_preparer>
<target_preparer class="com.android.tradefed.targetprep.PushFilePreparer">
<option name="cleanup" value="true" />
<option name="push" value="VtsHalNfcV1_0TargetTest->/data/local/tmp/VtsHalNfcV1_0TargetTest" />
</target_preparer>
<test class="com.android.tradefed.testtype.GTest" >
<option name="native-test-device-path" value="/data/local/tmp" />
<option name="module-name" value="VtsHalNfcV1_0TargetTest" />
<option name="native-test-timeout" value="600000"/>
</test>
</configuration>