Jack Yu f916560188 Extend test timeout value from 180s to 600s ... There are several test cases that may take longer duration to complete. Extend the timeout value to ensure there is sufficient running duration. Bug: 174717076 Test: atest VtsHalNfcV1_0TargetTest Change-Id: I4fc15184f0715131c45247820e1edbaae511b8a3		2020-12-11 16:01:45 +08:00
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default	Remove libhwbinder/libhidltransport deps	2019-09-06 01:07:02 +00:00
vts/functional	Extend test timeout value from 180s to 600s	2020-12-11 16:01:45 +08:00
Android.bp	update hidl .bp	2020-07-07 16:22:36 +09:00
INfc.hal	Convert all comments into "doxygen-ready" comments.	2017-03-28 16:10:42 -07:00
INfcClientCallback.hal	Convert all comments into "doxygen-ready" comments.	2017-03-28 16:10:42 -07:00
types.hal	NFC: Add @exports to generate nfc-base.h headers.	2016-11-28 17:34:15 -08:00