b809329dc7
The AesEcbPkcs7PaddingCorrupted test has been incorrect since it was originally introduced -- it was feeding the original message as input to the decryption operation, rather than the corrupted ciphertext. As a result, the expected error code was also wrong -- INVALID_INPUT_LENGTH is appropriate for a too-short cipher text (length 1 in this case), whereas a corrupt-but-correct-length cipher text should give INVALID_ARGUMENT. Fix the test, and add a separate test to cover what was inadvertently being tested before. Add a sentence to the HAL spec to describe what expected and tested by CTS/VTS. Bug: 194126736 Test: VtsAidlKeyMintTargetTest, VtsHalKeymasterV4_0TargetTest Change-Id: Iaa5e42768814197f373797831093cf344d342b77 |
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| .. | ||
| default | ||
| support | ||
| vts | ||
| Android.bp | ||
| IKeymasterDevice.hal | ||
| types.hal | ||