platform_hardware_interfaces/sensors
AOYAGI Takako e760f283cc Fix for VTS test CleanupConnectionsOnInitialize am: 45a15ed8b9 am: c0fd000566 am: 16b926e728
Original change: https://android-review.googlesource.com/c/platform/hardware/interfaces/+/2486695

Change-Id: I9d89b36e50daf41894930baeb7bc59f5d45d27a7
Signed-off-by: Automerger Merge Worker <android-build-automerger-merge-worker@system.gserviceaccount.com>
2023-03-16 00:07:28 +00:00
..
1.0 Support AIDL IAllocator for direct channel tests 2022-06-10 02:09:11 +00:00
2.0 Support AIDL IAllocator for direct channel tests 2022-06-10 02:09:11 +00:00
2.1 Support AIDL IAllocator for direct channel tests 2022-06-10 02:09:11 +00:00
aidl Adds AndroidTest.xml for AIDL sensors VTS test 2022-08-04 19:59:05 +00:00
common Fix for VTS test CleanupConnectionsOnInitialize am: 45a15ed8b9 am: c0fd000566 am: 16b926e728 2023-03-16 00:07:28 +00:00