platform_hardware_interfaces/input/classifier/1.0
Siarhei Vishniakou 0a51242abc Convert InputClassifierTest to parametrized test
The test is currently based on old vts harness and not in vts suite.

Bug: 150383004
Test: atest VtsHalInputClassifierV1_0TargetTest
Change-Id: I5df4eff845fd49b8663d1589c5314d5acf4b5057
Merged-In: I5df4eff845fd49b8663d1589c5314d5acf4b5057
(cherry picked from commit 25a866eecc)
2020-03-31 06:18:34 +00:00
..
default Remove libhwbinder/libhidltransport deps 2019-09-06 01:07:02 +00:00
vts Convert InputClassifierTest to parametrized test 2020-03-31 06:18:34 +00:00
Android.bp Update hidl makefiles for bpfmt 2019-04-18 18:13:05 -07:00
IInputClassifier.hal Add reset to InputClassifier HAL 2019-01-28 13:52:10 -08:00