From 25a4d708e2ead44eea4e7026ba396475646b6365 Mon Sep 17 00:00:00 2001
From: Tom Cherry <tomcherry@google.com>
Date: Wed, 29 Apr 2020 10:15:15 -0700
Subject: [PATCH] logd: disable flaky logd.timeout test

This test is repeatedly seen to be flaky.  Disable it until we can run
tests against a dedicated logd instance.

Bug: 155146087
Test: logd-unit-tests
Change-Id: I0cd953955f613e40d17df73f70543d7d2f0925b6
---
 logd/tests/logd_test.cpp | 2 ++
 1 file changed, 2 insertions(+)

diff --git a/logd/tests/logd_test.cpp b/logd/tests/logd_test.cpp
index b09248985..1dd5c8696 100644
--- a/logd/tests/logd_test.cpp
+++ b/logd/tests/logd_test.cpp
@@ -583,6 +583,7 @@ TEST(logd, timeout_start_epoch) {
         "dumpAndClose lids=0,1,2,3,4,5 timeout=6 start=0.000000000");
 }
 
+#ifdef ENABLE_FLAKY_TESTS
 // b/26447386 refined behavior
 TEST(logd, timeout) {
 #ifdef __ANDROID__
@@ -717,6 +718,7 @@ TEST(logd, timeout) {
     GTEST_LOG_(INFO) << "This test does nothing.\n";
 #endif
 }
+#endif
 
 // b/27242723 confirmed fixed
 TEST(logd, SNDTIMEO) {